发明名称 Manufacturing method of CMOS thin film semiconductor device and CMOS thin film semiconductor device manufactured thereby
摘要 A simple and convenient method of manufacturing a CMOS TFT semiconductor circuit device wherein a doping layer doped into a first conductivity type without a mask is compensated with a dopant of a second conductivity type having a high density so that the conductivity type of the doping layer of first conductivity type is inverted into the second conductivity type, and further, in order to carry out the inversion of the conductivity type by the compensation easily and reliably, the surface density of the dopant of the doping layer of first conductivity type is reduced prior to compensating with the dopant of second conductivity type.
申请公布号 US6127210(A) 申请公布日期 2000.10.03
申请号 US19960724834 申请日期 1996.10.03
申请人 HITACHI, LTD. 发明人 MIMURA, AKIO;SUGA, HIROSHI;NAGAI, MASAICHI;SHINAGAWA, YOUMEI;IKUTA, ISAO
分类号 G02F1/136;G02F1/1368;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/092;H01L29/786;(IPC1-7):H01L21/00 主分类号 G02F1/136
代理机构 代理人
主权项
地址