发明名称 |
SENSE AMPLIFIER OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A sense-amp of a semiconductor memory device is provided to ensure a sufficient sensing margin in case of a reading operation, and enhances a sensing speed by making a precharge circuit of sense-amp supply the same current in a sensing period. CONSTITUTION: A data line corresponds to a cell. A dummy data line is compared with a voltage level of the data line. A reference voltage generator(100) provides a reference voltage compared with a voltage level of the data line to the dummy data line. The reference voltage generator(100) includes a first bias part, a first pass part, and a first precharge part. The first bias part generates a reference voltage according to an activated sensing signal. The first pass part forms a current passage after receiving the reference voltage. The first precharge part precharges the dummy data line. A sensing voltage generator (200) generates a sensing voltage provided from a data line of the selected cell. A differential amplifier(300) amplifies a difference between the sensing voltages. The sensing voltage generator(200) includes a second bias part, a second pass part, and a second precharge part. The second bias part generates a reference voltage according to the sensing signal. The second pass part forms a current path after receiving the reference voltage. The second precharge part precharges the dummy data line.
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申请公布号 |
KR100267012(B1) |
申请公布日期 |
2000.10.02 |
申请号 |
KR19970079450 |
申请日期 |
1997.12.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DONG WOO;IM, HEUNG SOO |
分类号 |
G11C17/18;G11C7/06;G11C11/407;G11C11/419;G11C16/06;(IPC1-7):G11C11/407 |
主分类号 |
G11C17/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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