发明名称 SENSE AMPLIFIER OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A sense-amp of a semiconductor memory device is provided to ensure a sufficient sensing margin in case of a reading operation, and enhances a sensing speed by making a precharge circuit of sense-amp supply the same current in a sensing period. CONSTITUTION: A data line corresponds to a cell. A dummy data line is compared with a voltage level of the data line. A reference voltage generator(100) provides a reference voltage compared with a voltage level of the data line to the dummy data line. The reference voltage generator(100) includes a first bias part, a first pass part, and a first precharge part. The first bias part generates a reference voltage according to an activated sensing signal. The first pass part forms a current passage after receiving the reference voltage. The first precharge part precharges the dummy data line. A sensing voltage generator (200) generates a sensing voltage provided from a data line of the selected cell. A differential amplifier(300) amplifies a difference between the sensing voltages. The sensing voltage generator(200) includes a second bias part, a second pass part, and a second precharge part. The second bias part generates a reference voltage according to the sensing signal. The second pass part forms a current path after receiving the reference voltage. The second precharge part precharges the dummy data line.
申请公布号 KR100267012(B1) 申请公布日期 2000.10.02
申请号 KR19970079450 申请日期 1997.12.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG WOO;IM, HEUNG SOO
分类号 G11C17/18;G11C7/06;G11C11/407;G11C11/419;G11C16/06;(IPC1-7):G11C11/407 主分类号 G11C17/18
代理机构 代理人
主权项
地址