发明名称 |
METHOD OF FABRICATING POLYSILICON PATTERN OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A formation method of polysilicon patterns is provided to easily achieve depth of focus margin and to simplify the manufacturing process by using a polysilicon and an etched oxide pattern as a mask. CONSTITUTION: After sequentially depositing a first oxide layer(12), a first polysilicon(13), a second oxide layer(14) and a second polysilicon(15) on a semiconductor substrate(11), the second polysilicon(15) is etched by using a photoresist pattern(16) as a mask. After removing the photoresist pattern(16), the second oxide layer(14) is then etched by using the etched second polysilicon pattern as a mask. The first polysilicon(13) is then etched by using the etched second oxide pattern as a mask.
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申请公布号 |
KR100265989(B1) |
申请公布日期 |
2000.10.02 |
申请号 |
KR19930013650 |
申请日期 |
1993.07.20 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, SANG KYUN;HA, DEOK YONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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