发明名称 METHOD OF FABRICATING POLYSILICON PATTERN OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A formation method of polysilicon patterns is provided to easily achieve depth of focus margin and to simplify the manufacturing process by using a polysilicon and an etched oxide pattern as a mask. CONSTITUTION: After sequentially depositing a first oxide layer(12), a first polysilicon(13), a second oxide layer(14) and a second polysilicon(15) on a semiconductor substrate(11), the second polysilicon(15) is etched by using a photoresist pattern(16) as a mask. After removing the photoresist pattern(16), the second oxide layer(14) is then etched by using the etched second polysilicon pattern as a mask. The first polysilicon(13) is then etched by using the etched second oxide pattern as a mask.
申请公布号 KR100265989(B1) 申请公布日期 2000.10.02
申请号 KR19930013650 申请日期 1993.07.20
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, SANG KYUN;HA, DEOK YONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址