发明名称 SURFACE POTENTIAL MEASURING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To detect precisely a surface potential, even if the surface potential is a high potential. SOLUTION: In this measuring method of a potential on a sample surface by using a potential detecting probe, a probe P vibrating in parallel with the sample surface is used as the potential detecting probe. And a surface potential of the sample S is measured by the operation of an electrostatic force working between charges on the probe P and on the sample S, by utilizing the change of the vibrating state of the probe P. This device is equipped with such a potential detecting probe P that the probe P head facing to the sample S surface is supported vibratingly in parallel with the sample S surface, a vibration exciting device A for vibrating forcedly the probe P, and a vibration state detecting means (PD, K) for detecting the change of the vibrating state of the probe P, and the surface potential of the sample S is measured by utilizing the variation of the vibrating state.
申请公布号 JP2000266794(A) 申请公布日期 2000.09.29
申请号 JP19990069300 申请日期 1999.03.15
申请人 FUJI XEROX CO LTD 发明人 YONEYAMA HIROTO;YAMAZAKI KAZUO;WATANABE HIROYUKI
分类号 G01R29/12;G01Q60/24;G01Q60/30;G01Q60/32;G01R29/24;(IPC1-7):G01R29/12 主分类号 G01R29/12
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