| 摘要 |
PROBLEM TO BE SOLVED: To obtain an electronic system, with a self-diagnostic function which can evaluation the logic computing operation of a circuit to be tested, by substituting a simulation apparatus which can execute a logic simulation in the small number of clock cycles even when an actual circuit is not started in order to evaluate the logic computing operation of the circuit to be tested. SOLUTION: A random-number generation means is installed in such a way that, when the serial output of data constituting a pseudo random-number pattern in started, a pseudo random-number pattern which shifts the pseudo random-number pattern by one bit portion is stored and that, when a scan path circuit 13 parallelly inputs the computed result of a circuit 14 to be tested, the data constituting the pseudo random-number pattern is serially outputted to the scan path circuit. |
