| 摘要 |
<p>A method of manufacturing a semiconductor device in which the manufacturing steps are controlled based on the information for identifying semiconductor chips, and a semiconductor manufactured by the method. By this method, the problem that the production efficiency is decreased when a semiconductor manufacturing system suitable for mass production of one kind is applied to job-shop production is solved. History information on semiconductor chips, wafers, and lots is recorded in an electronic file and managed. The information is written on a chip as identification codes and is fed back to the semiconductor manufacturing step and the wafer testing step. Thereby, an improved production efficiency in job-shop production can be expected.</p> |
