发明名称 ROOM TEMPERATURE WET CHEMICAL GROWTH PROCESS OF SiO BASED OXIDES ON SILICON
摘要 <p>Disclosed is a room temperature wet chemical growth (RTWCG) process of SiO-based insulator coatings on silicon substrates for electronic and photonic (optoelectronic) device applications. The process includes soaking the Si substrates into the growth solution. The process utilizes a mixture of H2SiF6, N-n-butylpyridinium chloride, redox Fe2+/Fe3+ aqueous solutions, and a homogenous catalyst.</p>
申请公布号 WO2000057464(A1) 申请公布日期 2000.09.28
申请号 US2000007159 申请日期 2000.03.17
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