发明名称 Semiconductor device having an improved structure for preventing cracks, improved small-sized semiconductor and method of manufacturing the same
摘要 According to a typical invention of the inventions disclosed in the present application, a semiconductor chip with an electronic circuit formed therein is fixed to a die pad for a lead frame having projections formed on the back thereof, with an organic dies bonding agent. Pads on the semiconductor chip, and inner leads are respectively electrically connected to one another by metal thin lines. These portions are sealed with a molding resin. Further, each inner lead extends to the outside of the molding resin and is processed into gull-wing form for substrate mounting. Moreover, the inner lead is processed by soldering so that an external terminal is formed. Thus, since the projections are provided on the back of the die pad, the back of a packing material is brought into point contact with that of the die pad as compared with the conventional face-to-face contact. It is therefore possible to minimize the transfer of organic substances from the packing material. Further, since such transfer that a reduction in adhesive property occurs in the back of the die pad, is greatly reduced, the adhesiveness between the upper surface of the die pad and the molding resin is improved, whereby the resistance of SMD to the reflow is enhanced. <IMAGE>
申请公布号 EP1039541(A1) 申请公布日期 2000.09.27
申请号 EP20000110729 申请日期 1996.10.24
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 YAMADA, SHIGERU;UCHIDA, YASUFUMI;MURAKAMI, NORIKO;SHIZUNO, YOSHINORI
分类号 H01L21/60;H01L23/055;H01L23/31;H01L23/367;H01L23/485;H01L23/495;H01L23/498 主分类号 H01L21/60
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