发明名称 Method of forming aluminum interconnection layer
摘要 A method of forming an aluminum-based layer mainly including aluminum on a surface of an insulating layer and within a hole formed in the insulating layer. The method includes the steps of: carrying out a chemical vapor deposition to deposit the aluminum-based layer on the surface of the insulating layer and also to incompletely fill the hole to not less than 75% by volume of the hole by use of a source including at least one of alkyl groups and hydrogen so that a surface of the aluminum-based layer is terminated by the at least one of alkyl groups and hydrogen included in the source, and so that the surface of the aluminum-based layer is free of any natural oxide film; and carrying out a heat treatment, without formation of any natural oxide film on the surface of the aluminum-based layer, for causing a re-flow of the aluminum-based layer, whereby the at least one of alkyl groups and hydrogen promotes a migration of aluminum atoms on the surface of the aluminum-based layer.
申请公布号 US6123992(A) 申请公布日期 2000.09.26
申请号 US19980188381 申请日期 1998.11.10
申请人 NEC CORPORATION 发明人 SUGAI, KAZUMI
分类号 C23C16/06;C23C16/00;C23C16/20;C23C16/56;H01L21/28;H01L21/283;H01L21/285;H01L21/3205;H01L21/4763;H01L21/768;H01L23/52;(IPC1-7):C23C16/20;H01L21/476 主分类号 C23C16/06
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