发明名称 |
PRODUCTION OF SILICON SINGLE CRYSTAL, SILICON SINGLE CRYSTAL PRODUCED WITH THE SAME AND SILICON WAFER FROM THE SAME CRYSTAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon single crystal production process which enables growth of a silicon single crystal bar having high uniformity in interstitial oxygen concentration in the growth direction of the single crystal being grown, in a high yield and with high productivity, in a transverse magnetic field-applied CZ(Czochralski) method. SOLUTION: In the silicon single crystal production process for growing a silicon single crystal bar while applying a magnetic field perpendicular to the crystal growth axis to the melt in the crucible, when a silicon single crystal is pulled up from a silicon melt in a quartz crucible, the crystal growth is performed so that any one of a high temperature part and a low temperature part, both caused in the surface of the silicon melt in the crucible, is always positioned at the solid-liquid interface in the process of crystal growth.
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申请公布号 |
JP2000264784(A) |
申请公布日期 |
2000.09.26 |
申请号 |
JP19990071205 |
申请日期 |
1999.03.17 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
ITOI KIRIO;IINO EIICHI;ISHIZUKA TORU;OTA TOMOHIKO |
分类号 |
C30B29/06;(IPC1-7):C30B29/06 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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