发明名称 |
WAFER POLISHING DEVICE AND MANUFACTURE OF WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a wafer polishing device and a wafer polishing method capable of efficiently polishing a wafer by reducing a use amount of abrasives. SOLUTION: A wafer hold head 1 is provided with a hollow-state head main unit 2, diaphragm 5 extended in the head main unit 2, carrier 6 fixed to the diaphragm 5 to hold one surface of a wafer W to be displaceable in an axial line direction, and a retainer ring 7 provided in an external periphery of the carrier 6 to be displaceable in an axial line direction. An abrasive pocket 26 is formed in a surface abutting to a polishing pad 76 of this retainer ring 7. The abrasive pocket 26 communicates with an abrasive supply part 21 through a flexible pipeline 24 comprising an elastic material. When the wafer W is polished, the retainer ring 7 and the polishing pad 76 are brought into contact so as to clog an opening part of the abrasive pocket 26. |
申请公布号 |
JP2000263424(A) |
申请公布日期 |
2000.09.26 |
申请号 |
JP19990069337 |
申请日期 |
1999.03.15 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
KOBAYASHI TATSUNOBU;TANAKA HIROSHI |
分类号 |
B24B37/00;B24B37/04;B24B37/30;B24B37/32;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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