发明名称 WAFER POLISHING DEVICE AND MANUFACTURE OF WAFER
摘要 PROBLEM TO BE SOLVED: To provide a wafer polishing device and a wafer polishing method capable of efficiently polishing a wafer by reducing a use amount of abrasives. SOLUTION: A wafer hold head 1 is provided with a hollow-state head main unit 2, diaphragm 5 extended in the head main unit 2, carrier 6 fixed to the diaphragm 5 to hold one surface of a wafer W to be displaceable in an axial line direction, and a retainer ring 7 provided in an external periphery of the carrier 6 to be displaceable in an axial line direction. An abrasive pocket 26 is formed in a surface abutting to a polishing pad 76 of this retainer ring 7. The abrasive pocket 26 communicates with an abrasive supply part 21 through a flexible pipeline 24 comprising an elastic material. When the wafer W is polished, the retainer ring 7 and the polishing pad 76 are brought into contact so as to clog an opening part of the abrasive pocket 26.
申请公布号 JP2000263424(A) 申请公布日期 2000.09.26
申请号 JP19990069337 申请日期 1999.03.15
申请人 MITSUBISHI MATERIALS CORP 发明人 KOBAYASHI TATSUNOBU;TANAKA HIROSHI
分类号 B24B37/00;B24B37/04;B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/00
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