| 摘要 |
A method of testing high speed interconnectivity of circuit boards having components operable at a high speed system clock, employing an IEEE 1149.1 standard test method in which test data is shifted into and from the components at the rate of a test clock during Shift_In and Shift_Out operations, and having an Upd ate operation and a Capture operation between the Shift_In and Shift_Out operations, the components including a first group of components capable of performing the Updat e and Capture operations at the rate of the Test Clock only and a second group of components capable of performing the Update and Capture operations at the rate o f the system clock, the method comprising the steps of performing the Shift_In operation in all of the components concurrently at the rate of the Test Clock; performing the Update and Capture Operations in the first group of components at the rate of the Test Clock; and performing the Update and Capture operations in the second group of components at the rate of the system Clock. The method employs a novel integrated circuit, test controller and boundary scan cells.
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