发明名称 Tester for peripheral storage device
摘要 A tester for a peripheral storage device including a peripheral storage device guide received in a mobile rest which is translatable relative to a base frame. The peripheral storage device, which, when translated by the guide, connects with pogo-connectors installed in a supporting block on the base frame. The mobile rest includes a pusher for moving the mobile rest relative to the base frame, as damped by a damper.
申请公布号 US6124707(A) 申请公布日期 2000.09.26
申请号 US19970931124 申请日期 1997.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN-EUK;YOO, DAE-GEUN;NAM, CHANG-WOO
分类号 G11B33/08;G11B33/12;(IPC1-7):H01R11/00 主分类号 G11B33/08
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