| 摘要 |
PURPOSE:To enable exposure with an X-ray diffraction arc being divided across the width thereof to obtain lattice plane interval information and exposure of a pole figure directly in a short time. CONSTITUTION:A goniometer arm 12 which has an imaging plate 10 mounted on an imaging plate support base 11 is rotated while one X-ray diffraction arc is divided in plurality across the width thereof with a curved slit 14 set accurately by a curved slit fine adjustment mechanism 13 to expose the imaging plate 10 so that dynamic change of the X-ray diffraction arc undergoes an exposure on the imaging plate 10. Especially, the rotation of a sample 6 on a sample base 7 which has the center of rotation the same as that of the goniometer arm 12 is made to synchronize the rotation of the goniometer arm 12. This enables division of one X-ray diffraction arc in plurality across the width thereof thereby achieving dynamic exposure of a photosensitive surface of the imaging plate 10 continuously and the dividing of crystal particles directly on a pole figure in terms of the interval of lattice planes thereby achieving a projection exposure. |
