| 摘要 |
PROBLEM TO BE SOLVED: To surely discriminate only a true defect without being affected by irregularity or the like included in the photographed image of the package of an electronic component. SOLUTION: This device is provided with image pickup means (103-105) for photographing the surface of an inspection object 102 and obtaining a gradation level for respective coordinates, void candidate area extraction means (106-108) for obtaining areas whose area is larger than a preset value among the areas of successive coordinates whose gradation level is lower than the preset value as void candidate areas, a void candidate area extension means 109 for widening the void candidate areas to the periphery and obtaining void candidate extension areas, a differentiation means 110 for obtaining the derivation of the gradation level for the respective void candidate extension areas, area calculation means (110-112) for obtaining the area for which the derivation is larger than a preset derivation for the respective void candidate extension areas and a judgment means 113 for judging that the defect is present inside the void candidate areas provided with the area larger than a preset area value. |
