| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor device inspection circuit which can cope with semiconductor devices which require different test signals for circuit inspections and call generate different test signals in accordance with the types of semiconductor devices to be inspected. SOLUTION: A semiconductor device inspection circuit is provided with a control circuit 10a which generates a control signal for controlling a boundary scanning cell incorporated in a semiconductor device to be inspected in accordance with an inspection mode selecting signal and switching circuits 30, 31, and 32 which output an inspection mode control signal to the control circuit 10a or the semiconductor device in accordance with a selection control signal so as to supply the inspection mode control signal or the inspection control signal generated correspondingly to the inspection mode control signal to the semiconductor device to be inspected in accordance with the type of the semiconductor device. |
