| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit allowing reduction in the number of control signals from an LSI outside in an LSI having a plurality of scan chains. SOLUTION: Scanning flip-flops are represented by f101-f112, control elements are represented by c101-c106, data set terminals are represented by D1n, D1n+1, scan-in terminals are represented by IN1n, IN1n+1, scan-out terminals are represented by OUT1n, OUT1n+1, scan control terminals are represented by NT1n, NT1n+1, and scan chains are constructed of the scanning flip-flops f101-f106 and f107-f102. The internal control elements c101, c102, c103 of the scan chain are individually controlled by outputs s101, s102, s103 of the flip-flops f107, f109, f111.
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