发明名称 DEFECT INSPECTION METHOD AND DEVICE AND DEFECT INSPECTION SUPPORT METHOD
摘要 PROBLEM TO BE SOLVED: To improve reliability for inspecting a defect by enabling a defect candidate to be verified easily by the visual inspection of an image or the like and the defect to be verified by all means. SOLUTION: In a defect inspection according to the magnetic powder flaw detection method for applying ultraviolet rays to a test piece 1 and emitting fluorescence by a crack defect 2a, the image of the surface of the test piece 1 is picked up by a color television camera 3 via an ultraviolet ray cut filter 5. An original picture according to R, G, and B signals being outputted from the color television camera 3 is stored in an image memory 7 temporarily. The original picture is displayed on a color monitor 9, at the same time a computer 8 processes a G image and detects a defect candidate, and adds and displays a defect candidate marker for each defect candidate in the original picture being displayed on the color monitor 9. An inspector determines the defect candidate in the original picture according to the defect candidate marker and visually verifies whether the defect is a true crack defect or a pseudo defect for the defect candidate. The original picture image and an inspection result are stored in a data storage 11.
申请公布号 JP2000258398(A) 申请公布日期 2000.09.22
申请号 JP19990067091 申请日期 1999.03.12
申请人 HITACHI LTD 发明人 ASANO TOSHIRO;SAKAI KAORU;TAGUCHI TETSUO;TANAKA ISAO
分类号 G01N21/91;G01N21/89;G01N27/84;(IPC1-7):G01N27/84 主分类号 G01N21/91
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