发明名称 Apparatus for heating electronic components
摘要 <p>A test fixture for the testing of electronic assemblies (6). The test fixture including locating means to allow the electronic assembly or assemblies (6) placed therein to be located in the required test locations. The fixture also includes at least one heating means (2) which is located with respect to the electronic assemblies (6) to contact with one or a plurality of the components which are required to be heated during the testing of the electronic assembly (6). &lt;IMAGE&gt;</p>
申请公布号 EP1037062(A2) 申请公布日期 2000.09.20
申请号 EP20000301787 申请日期 2000.03.03
申请人 PACE MICRO TECHNOLOGY PLC 发明人 RODWELL, JOHN;PAWLAK, RICHARD;SKOW, PAUL
分类号 G01R31/316;(IPC1-7):G01R31/28 主分类号 G01R31/316
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