发明名称 Semiconductor processing methods of forming hemispherical grain polysilicon layers, methods of forming capacitors, and capacitors
摘要 In one aspect of the invention, an amorphous layer of silicon is provided which has a gradient of thickness variation. The amorphous layer of silicon is transformed into a hemispherical grain polysilicon layer that has varying grain size therein. In another aspect of the invention, a material is provided and has an upper surface and inwardly tapered openings. A first electrically conductive electrode layer is formed within the openings and includes a plurality of hemispherical grain polysilicon layers. At least one of the hemispherical grain polysilicon layers has a grain size gradient defined by a smaller grain size in a region proximate the upper surface and a larger grain size beneath the region with the smaller grain size. An electrically insulative layer is formed over the first electrode layer and a second electrically conductive electrode layer is formed over the electrically insulative layer.
申请公布号 US6121084(A) 申请公布日期 2000.09.19
申请号 US20000493040 申请日期 2000.01.27
申请人 MICRON TECHNOLOGY, INC. 发明人 COURSEY, BELFORD T.
分类号 H01L21/02;H01L21/316;H01L21/318;(IPC1-7):H01L21/302 主分类号 H01L21/02
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