发明名称 Method for measuring yield and moisture
摘要 A method and apparatus for measuring at least one parameter including mass flow rate or moisture content of material moved by a conveyor are disclosed herein. The method includes the steps of applying an electric field to the material using a non-intrusive sensor assembly, generating signals related to the dielectric value of the material, and processing the signals to determine the parameter. The apparatus includes a capaciflector sensor assembly located along a surface of the conveyor to generate an electric field applied to the material and a processing circuit to determine the parameter based upon the signals output from the sensor assembly. The sensor assembly includes a first conductor spaced between a stationary member of the conveyor and the material, and a second conductor spaced between the first conductor and the stationary member to act as a shield for reducing parasitic capacitance between the first conductor and a reference plane. The first conductor forms a first electrode of a sensor capacitor and the material forms a second electrode, and the capacitance depends on the parameters of the material. A cover may be located between the sensor assembly and material. The processing circuit performs a frequency analysis over any number of frequencies to determine the mass flow rate, moisture content or type of material, and the conveyor's speed.
申请公布号 US6121782(A) 申请公布日期 2000.09.19
申请号 US19970835610 申请日期 1997.04.09
申请人 CASE CORPORATION 发明人 ADAMS, BRIAN T.;HALE, GEORGE H.;SCHUBERT, WILLIAM L.
分类号 G01F1/64;G01F1/76;G01N27/22;(IPC1-7):G01R27/26 主分类号 G01F1/64
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