发明名称 Method for manufacturing semiconductor device capable of flattening surface of selectively-grown silicon layer
摘要 In a method for manufacturing a semiconductor device, an impurity diffusion region is formed within a semiconductor substrate. Then, a chemical dry etching process or a heating process is carried out to remove a contamination layer from the impurity diffusion region. Then, a silicon layer is selectively grown on the impurity diffusion region.
申请公布号 US6121120(A) 申请公布日期 2000.09.19
申请号 US19980130655 申请日期 1998.08.07
申请人 NEC CORPORATION 发明人 WAKABAYASHI, HITOSHI;TATSUMI, TORU
分类号 H01L21/20;H01L21/265;H01L21/285;(IPC1-7):H01L21/20 主分类号 H01L21/20
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