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发明名称
Charged particle beam lithography apparatus for forming pattern on semi-conductor
摘要
申请公布号
US6121625(A)
申请公布日期
2000.09.19
申请号
US19980087296
申请日期
1998.05.29
申请人
HITACHI, LTD.
发明人
ITO, HIROYUKI;SOHDA, YASUNARI;SOMEDA, YASUHIRO;NAKAYAMA, YOSHINORI;OKUMURA, MASAHIDE;SATOH, HIDETOSHI
分类号
G03F7/20;C08F10/02;G03F1/16;G03F1/20;H01J37/147;H01J37/317;H01L21/027;(IPC1-7):H01J37/304
主分类号
G03F7/20
代理机构
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