| 摘要 |
A semiconductor device having a fuse has a fuse and a resistance connected in series between power-supply potential and ground and decides whether the fuse is fused in accordance with the potential of the connection point between the fuse and the resistance connected in series between the power-supply potential and the ground under the normal operating state. A decision circuit is included whose input terminal is connected to the connection point between the fuse and the resistance to decide whether the fuse is fused. A switching circuit is included which connects a test resistance in parallel with the fuse at the time of a test but does not connect the test resistance under the normal state and at the time of the test, a fuse resistance value in a range wider than the range for deciding whether a fuse is fused under the normal state is decided to be defective to decide whether the fuse is fused.
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