发明名称 METHOD FOR CHECKING MAGNET RESISTANCE HEAD FOR MAGNET DISK DRIVE
摘要 PURPOSE: A method for checking magnet resistance head for magnet disk drive is provided to improve the reliability of a magnet disk drive by measuring the change of a resistance value of the magnet resistance head and comparing the measured change value with a reference value to judge the badness of a magnet resistance head. CONSTITUTION: A read bias current(Ird) value through an analog digital converter(ADC) pin of a CPU and a voltage(VMR) between both sides of a magnet resistance sensor of a magnet resistance head are measured(301). A resistance(RMR) value of the magnet resistance sensor is computed using the read bias current(Ird) value and the voltage(VMR)(302). The computed resistance(RMR) value is compared with a predetermined permission resistance(RMR) range(303). It is processed as a retest or to be disqualified when the computed resistance(RMR) value is over the predetermined permission resistance(RMR) range(304). It is processed to be qualified when the computed resistance(RMR) value is within the predetermined permission resistance(RMR) range(305), and the computed resistance(RMR) value is stored in the memory(305).
申请公布号 KR20000055835(A) 申请公布日期 2000.09.15
申请号 KR19990004680 申请日期 1999.02.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YONG SOO
分类号 G11B5/455;(IPC1-7):G11B5/455 主分类号 G11B5/455
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