发明名称 APPARATUS FOR TESTING CHARACTERISTICS OF SMD SAW FILTER
摘要 PURPOSE: An apparatus for examining property of an SMD SAW filter is provided to smoothly examine property of an SAW filter whose terminals are not protruded to the outside. CONSTITUTION: An installing groove(14) is formed on a central part(12) of a body of a housing(10) which is H-shape. Bolt holes(16) are formed on four ends. An SMD SAW filter(50) is mounted on the installing groove(14). Input/output PCB substrates(42,44) are installed on both sides of the central part(12). The central part(12) is cut on the installing groove(14) so as for connecting ends of the input/output PCB substrates(42,44) to be inserted. Input/output connectors(32,34) are coupled to the four bolt holes(16) which are formed on both sides of the housing(10). Both side ends of a measurer(20) are connected to the input/output connector(32,34) which are coupled to the both side ends of the housing. A signal output from an output end of the measurer(20) is applied to the output PCB substrate(44) through the SAW filter(50). The signal applied to the output PCB substrate(44) is applied to the measurer(20) through the output connector(34).
申请公布号 KR100266230(B1) 申请公布日期 2000.09.15
申请号 KR19970068099 申请日期 1997.12.12
申请人 CHUNGHO ELCOM, CO. 发明人 HONG, SUNG-SU
分类号 H05K13/08;(IPC1-7):H05K13/08 主分类号 H05K13/08
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