发明名称 |
APPARATUS AND METHOD FOR CALCULATING ERROR AMOUNT OF EXPOSURE EQUIPMENT |
摘要 |
PURPOSE: An apparatus and method for calculating an error amount of an exposure equipment is to define and correct a distortion aberration when a pattern on a mask is exposed to light on a corresponding substrate. CONSTITUTION: An apparatus for calculating an error amount of an exposure equipment comprises: a coordinate value measuring part(1) for calculating coordinate values corresponding to a directed position of a pattern formed on a mask and a directed position of an exposed pattern on a substrate and outputting the calculated coordinate values; and an error occurrence amount calculating part(2) for reading the coordinate values output from the coordinate value measuring part, calculating respective error amounts of a non-linear conversion function and a linear function using the least square method and performing an error correction for the calculated non-linear conversion function and the linear function.
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申请公布号 |
KR20000055828(A) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19990004668 |
申请日期 |
1999.02.10 |
申请人 |
SAMSUNG TECHWIN CO., LTD. |
发明人 |
GANG, WAN SUN |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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