发明名称 APPARATUS AND METHOD FOR CALCULATING ERROR AMOUNT OF EXPOSURE EQUIPMENT
摘要 PURPOSE: An apparatus and method for calculating an error amount of an exposure equipment is to define and correct a distortion aberration when a pattern on a mask is exposed to light on a corresponding substrate. CONSTITUTION: An apparatus for calculating an error amount of an exposure equipment comprises: a coordinate value measuring part(1) for calculating coordinate values corresponding to a directed position of a pattern formed on a mask and a directed position of an exposed pattern on a substrate and outputting the calculated coordinate values; and an error occurrence amount calculating part(2) for reading the coordinate values output from the coordinate value measuring part, calculating respective error amounts of a non-linear conversion function and a linear function using the least square method and performing an error correction for the calculated non-linear conversion function and the linear function.
申请公布号 KR20000055828(A) 申请公布日期 2000.09.15
申请号 KR19990004668 申请日期 1999.02.10
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 GANG, WAN SUN
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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