发明名称 A METHOD OF FABRICATING SEMICONDUCTOR MEMORY
摘要 PURPOSE: A method for fabricating a semiconductor device is to prevent a contact-not-open in forming a storage node contact hole and a metal contact hole, and improve a misalign margin between the storage node contact hole and the metal contact hole. CONSTITUTION: The first insulating layer(106) is formed on a semiconductor substrate(100) having a cell array region and a peripheral circuit region. A pad contact hole is formed by etching the first insulating layer. A conductive layer pad(110b) is formed by fill the pad contact hole with a conductive layer. The second insulating layer(112a) is formed on the first insulating layer. A bit line(114') is formed on the second insulating layer. After removing the second insulating layer except for the lower part of the bit line by an etch-back process, The third and fourth insulating layers(118, 120) are formed in this order on the entire surface of the semiconductor substrate. A storage node contact hole is formed at the cell array region by etching the third and fourth insulating layers. A metal contact hole is formed at the periphery circuit region by etching the fourth and third insulating layer and the first insulating layer.
申请公布号 KR100266279(B1) 申请公布日期 2000.09.15
申请号 KR19970081009 申请日期 1997.12.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YUN-JAE;NOH, JUN-YONG;CHUN, KWANG-YOUL
分类号 H01L27/108;H01L21/311;H01L21/8242;H01L27/10;(IPC1-7):H01L27/10 主分类号 H01L27/108
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