发明名称 |
A METHOD OF FABRICATING SEMICONDUCTOR MEMORY |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is to prevent a contact-not-open in forming a storage node contact hole and a metal contact hole, and improve a misalign margin between the storage node contact hole and the metal contact hole. CONSTITUTION: The first insulating layer(106) is formed on a semiconductor substrate(100) having a cell array region and a peripheral circuit region. A pad contact hole is formed by etching the first insulating layer. A conductive layer pad(110b) is formed by fill the pad contact hole with a conductive layer. The second insulating layer(112a) is formed on the first insulating layer. A bit line(114') is formed on the second insulating layer. After removing the second insulating layer except for the lower part of the bit line by an etch-back process, The third and fourth insulating layers(118, 120) are formed in this order on the entire surface of the semiconductor substrate. A storage node contact hole is formed at the cell array region by etching the third and fourth insulating layers. A metal contact hole is formed at the periphery circuit region by etching the fourth and third insulating layer and the first insulating layer.
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申请公布号 |
KR100266279(B1) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19970081009 |
申请日期 |
1997.12.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YUN-JAE;NOH, JUN-YONG;CHUN, KWANG-YOUL |
分类号 |
H01L27/108;H01L21/311;H01L21/8242;H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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