发明名称 |
METHOD FOR MANUFACTURING A CYLINDRICAL CHARGE STORAGE ELECTRODE |
摘要 |
PURPOSE: A method for forming a cylindrical type storage electrode is to enlarge surface area of the storage electrode by providing of unevenness to the sidewall thereof using a wet-etching ratio of grain boundary between the micro-grains of polysilicon, thereby improving reliability of a semiconductor substrate. CONSTITUTION: An undoped oxide layer is deposited on an interlayer dielectric(107). The interlayer dielectric and the undoped oxide layer are etched to form a contact hole for storage electrode. The first amorphous silicon layer is deposited on the resultant structure including the contact hole. A doped oxide layer is deposited on the first amorphous silicon layer. The doped oxide layer and the first amorphous silicon layer are successively etched by using the storage electrode as a mask. The second and third doped amorphous silicon layers are deposited on the resultant structure, and then etched to form a spacer(106). The undoped and doped oxide layers are removed. The spacer is wet-etched in etching solution to provide the surface thereof with unevenness after crystallizing the first/second/third amorphous silicon layers by an annealing.
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申请公布号 |
KR100265840(B1) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19930030775 |
申请日期 |
1993.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
IM, CHAN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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