发明名称 |
METHOD OF REWORKING WAFER FOR SEMICONDUCTOR DEVICE AND OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for reworking a semiconductor device manufacturing wafer is to completely remove and rework a photoresist coated abnormally by using an innoxious thinner composition having the proper melting speed and the volatility. CONSTITUTION: A photoresist(23) is coated on a semiconductor substrate(21) to form a specific pattern on the semiconductor substrate. The semiconductor substrate with the photoresist formed thereon is loaded on a rotatable vacuum chuck. A thinner composition is supplied to the loaded semiconductor substrate. The thinner composition is produced by mixing 70 wt % to 80 wt % of ethyl-3-ethoxy propionate, 17 wt % to 23 wt % of ethyl lactate, and 4 wt % to 7 wt % of gamma-butyro lactone. The photoresist is soaked in the thinner composition for a predetermined time until it melted by the thinner composition. After rotating the vacuum chuck, the photoresist is removed by using the thinner composition.
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申请公布号 |
KR100265766(B1) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19980010005 |
申请日期 |
1998.03.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON, MI SOOK;LEE, CHUN DEUK;LEE, BO YONG |
分类号 |
C11D7/26;C11D7/50;G03F7/16;G03F7/30;G03F7/42;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
C11D7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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