发明名称 METHOD OF REWORKING WAFER FOR SEMICONDUCTOR DEVICE AND OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for reworking a semiconductor device manufacturing wafer is to completely remove and rework a photoresist coated abnormally by using an innoxious thinner composition having the proper melting speed and the volatility. CONSTITUTION: A photoresist(23) is coated on a semiconductor substrate(21) to form a specific pattern on the semiconductor substrate. The semiconductor substrate with the photoresist formed thereon is loaded on a rotatable vacuum chuck. A thinner composition is supplied to the loaded semiconductor substrate. The thinner composition is produced by mixing 70 wt % to 80 wt % of ethyl-3-ethoxy propionate, 17 wt % to 23 wt % of ethyl lactate, and 4 wt % to 7 wt % of gamma-butyro lactone. The photoresist is soaked in the thinner composition for a predetermined time until it melted by the thinner composition. After rotating the vacuum chuck, the photoresist is removed by using the thinner composition.
申请公布号 KR100265766(B1) 申请公布日期 2000.09.15
申请号 KR19980010005 申请日期 1998.03.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, MI SOOK;LEE, CHUN DEUK;LEE, BO YONG
分类号 C11D7/26;C11D7/50;G03F7/16;G03F7/30;G03F7/42;H01L21/027;(IPC1-7):H01L21/027 主分类号 C11D7/26
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