发明名称 MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To make variable the aperture of an orifice provided on a partioning wall for partitioning an intermediate chamber and a measuring chamber of a mass spectrometer for arbitrarily regulating the sensitivity and resolution of ions. SOLUTION: This mass spectrometer is composed of an ion source 1 for ionizing a sample, an intermediate chamber 3 for receiving ions generated in the ion source 1 in a following step, and a measuring chamber 8 located downstream of the chamber 3 and arranged with various kinds of constituents for an ion optical system. A variable slit 10 with various kinds of apertures and a restriction of which an aperture is arbitrarily made variable are provided in a partitioning wall part for partitioning the chamber 3 and the chamber 8.
申请公布号 JP2000251831(A) 申请公布日期 2000.09.14
申请号 JP19990053150 申请日期 1999.03.01
申请人 JEOL LTD 发明人 SUZUKI TAKAYUKI;TAMURA ATSUSHI;FUJIMAKI SUSUMU
分类号 H01J49/06;G01N27/62;(IPC1-7):H01J49/06 主分类号 H01J49/06
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