发明名称 THERMOMECHANICAL ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To make efficient an entire measurement operation by easily replacing a probe in a thermomechanical analysis device. SOLUTION: A slit for replacing a probe is provided at the upper portion of an opening for replacing a sample being provided on the side surface of a sample tube 1 for installing a sample, and the slit is utilized to take out and insert probe 2a and 2b. As a result, the probe can be replaced without removing the sample tube 1 and a thermocouple, thus improving working efficiency. Also, the probe is taken out toward a worker's side from the sample tube 1 (in an opposite direction for insertion), thus saving space for operation.
申请公布号 JP2000249669(A) 申请公布日期 2000.09.14
申请号 JP19990055488 申请日期 1999.03.03
申请人 SEIKO INSTRUMENTS INC 发明人 SUZUKI TETSUO
分类号 G01N25/16;G01N3/02;G01N3/14;G01N3/18;(IPC1-7):G01N25/16 主分类号 G01N25/16
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