WET FLUORESCENT MAGNETIC PARTICLE INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To improve an inspection accuracy without requiring shading correction by facilitating shifting a specular reflection light by a light source out of a camera visual field, thereby reducing an illuminance irregularity of a surface of a material to be inspected and raising an illuminance within the camera visual field. SOLUTION: A magnetic particle solution is adhered to a surface of a material 1 to be inspected while the material being transferred is magnetized. Magnetic particles aggregating to a leaking magnetic flux part generated to a defect part emit light because of an illuminating light source 2. Data of images picked up by a line sensor camera 3 is processed, thereby detecting the result of the surface of the material 1 according to this wet fluorescent magnetic particle inspection method. The camera 3 is arranged so that a scan direction S becomes orthogonal to a transfer direction T for the material 1 and perpendicular to the surface of the material 1. The light source 2 is set in parallel to the camera scanning direction S and inclined by an angleθto the surface of the material 1 whereby a specular reflection light 5 is prevented from entering a light- receiving face of the camera 3.