| 摘要 |
<p>A test head (10) for a semi-conductor integrated circuit tester comprises a housing (24) which has an air inlet opening (42) and an air outlet opening (48) and bounds a pin card space and an air chamber. Multiple pin cards (28) are located in the pin card space. A baffle structure divides the air chamber which is separated from the pin card space by a boundary surface, into an air supply duct (50) which provides communication between the air inlet opening (42) and the interior cavity (36) and an outlet plenum which provides communication between the pin card space and the air outlet opening (46) by way of the boundary surface. A fan is mounted in the interior cavity (36) for inducing a flow of air from the interior cavity (36) to the plenum by way of spaces between the pin cards.</p> |
