发明名称 SEMICONDUCTOR MEMORY AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To form a source and drain region before forming a gate and form a gate ferroelectric film self-alignedly against the source and drain region. SOLUTION: Ions are implanted with a dammy gate electrode formed right on a channel formation region of a semiconductor substrate 1 as a mask to form a source and drain region 5 self-alignedly against the dummy gate electrode. After a first interlayer insulating film 6 is formed over the entire surface, the first interlayer insulating film 6 is flattened to expose the surface of the dummy gate electrode. Then, the dummy gate electrode and a protective oxide film 3 are removed to form a trench 7. After a buffer dielectric film 8, a ferroelectric film 9, and gate electrode material 10 are deposited in order over the entire surface, these films and material are patterned to form a gate.
申请公布号 JP2000252372(A) 申请公布日期 2000.09.14
申请号 JP19990049397 申请日期 1999.02.26
申请人 SHARP CORP 发明人 MIYOSHI SATORU;ISHIHARA KAZUYA;KIJIMA TAKESHI
分类号 H01L21/8247;H01L21/28;H01L21/8242;H01L27/10;H01L27/108;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/8247
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