发明名称 ELECTRIC CHARACTERISTIC EVALUATING DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain an electric characteristic evaluating device which can accurately measure and evaluate the current-voltage characteristic, capacitance- voltage characteristic, and Hall effect characteristic of a sample and the temperature dependency characteristics of the characteristics with a single device. SOLUTION: An electric characteristic evaluating device is made to have a heating and cooling mechanism 2 which heats and cools a sample 4 composed of an element having a semiconductor circuit, a probe 5 which makes possible the supply and measurement of a voltage and current to all locations of the sample 4, a probe moving mechanism 6, an evacuating mechanism, and magnets 21. Therefore, the device can synthetically measure the voltage-current characteristic, voltage-capacitance characteristic, and Hall effect characteristic of the sample 4 and the temperature dependency characteristics when the temperature of the sample 4 is changed.
申请公布号 JP2000252331(A) 申请公布日期 2000.09.14
申请号 JP19990056832 申请日期 1999.03.04
申请人 MITSUBISHI HEAVY IND LTD 发明人 NAKANO KOUJI;SAKAMOTO HITOSHI
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址
您可能感兴趣的专利