发明名称 MOS GATE DEVICE WITH BURIED GATE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a MOS transistor with a trench gate structure. SOLUTION: A trench MOS gate device includes a single crystal semiconductor substrate 201 with a doped layer thereon. The upper layer has a plurality of main regions heavily doped with first polarity on an upper surface and extended over a drain region 203. The upper layer includes a plurality of source regions heavily doped with second polarity reverse to that of the main region. The gate trench 207 is extended from an upper surface 214 of the upper layer to the drain region 203 to separate the source region from the next region. The gate trench 207 has a floor 209 made of a dielectric layer, and a side wall 208. The gate trench 207 includes an insulating layer made of a conductive gate material contained with a selected level and a dielectric material extended over a gate material 210. In this case, the gate trench 207 is filled substantially with the dielectric material.
申请公布号 JP2000252468(A) 申请公布日期 2000.09.14
申请号 JP20000044636 申请日期 2000.02.22
申请人 INTERSIL CORP 发明人 KOCON CHRISTOPHER;ZENG JUN
分类号 H01L21/331;H01L21/336;H01L29/06;H01L29/423;H01L29/739;H01L29/78;H01L31/062;(IPC1-7):H01L29/78 主分类号 H01L21/331
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