发明名称 INSPECTION METHOD FOR ELECTRON SOURCE AND IMAGE DISPLAY DEVICE, ITS INSPECTION DEVICE, AND RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To greatly reduce inspection period, by reading one or more inspection results of a previous inspection performed before a target inspection, determining a priority of inspection places for the target inspection based on the read inspection results, and performing the target inspection according to the priority of the determined inspection places. SOLUTION: A value of element resistance measured prior to a lighted inspection is read in a memory of a control device 209. Difference between the measured value and the designed value of the element resistance is calculated. A priority of positions to be inspected about lighting according to magnitude of the calculated difference, the resulted positions are arranged in the ascending order of the priority to create a table, and the table is stored in the memory of the control device 209. A CCD camera 203 is moved to the highest region in priority in the table. Brightness data for each individual picture element lighted by impression of a voltage pulse is provided from images of the CCD camera 203, difference between the brightness data and the designed brightness is calculated. When the calculated difference is not less than a prescribed constant, the picture element is discriminated defective.
申请公布号 JP2000251733(A) 申请公布日期 2000.09.14
申请号 JP19990047167 申请日期 1999.02.24
申请人 CANON INC 发明人 FUJII AKIRA;TAKEGAMI TAKESHI
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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