| 摘要 |
PROBLEM TO BE SOLVED: To provide a non-volatile memory which can test the continuity of a bit line and to realize surely a test for the discontinuity of a bit line of a non-volatile memory. SOLUTION: A non-volatile memory 10 is constituted of plural flip-flop connected to each other end of each bit line other than a first register 11 consisting of plural flip-flop connected to each one end of each bit line 2 of a memory cell array 1, and is provided with a second register 12 for testing the discontinuity of each bit line 2. After a test device 20 writes data for test in the first register 11 of the non-volatile memory 10, transfers the data for test to the second register 12 through each bit line, reads out data of the second register 12, compares this read out data with data written in the first register 11, and discriminates existence of discontinuity of each bit line. |
