发明名称 MANUFACTURE OF TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a CMOS device on a semiconductor substrate. SOLUTION: This method includes a process 216 wherein conductive material having one work function is so formed as to cover an insulated semiconductor substrate, and a process 218 wherein part of the conductive material is reformed to change the work function of the conductive material, a first gate electrode is formed with the conductive material, and a second gate electrode is formed with the reformed part of the conductive material. A first transistor is an NMOS device, a second transistor is a PMOS device, and a CMOS device is constituted of the first and the second transistor. The conductive material includes a conductor selected among Ta, Mo, Ti and any given combination of these elements. The process for reforming the conductive material includes a process wherein part of the conductive material is exposed to plasma including gases such as nitrogen gas.
申请公布号 JP2000252371(A) 申请公布日期 2000.09.14
申请号 JP20000049739 申请日期 2000.02.25
申请人 TEXAS INSTR INC <TI> 发明人 WILKS GLEN D;SUMMERFELT SCOTT R
分类号 H01L27/092;H01L21/28;H01L21/336;H01L21/8238;H01L29/423;H01L29/49;(IPC1-7):H01L21/823 主分类号 H01L27/092
代理机构 代理人
主权项
地址