发明名称 Ion beam working apparatus
摘要 An ion beam working apparatus which can carry out a plurality of workings with good accuracy automatically is provided. When an ion beam current is changed, by setting differences in ion beam optical conditions, working without focal point shift or working position shift becomes possible and throughput increases can be expected. Differences in ion beam optical conditions of when an ion beam current is changed are stored in a computer and when the ion beam current amount is changed midway through automatic working those stored differences in ion beam optical conditions are set in the ion beam optical system.
申请公布号 US6118122(A) 申请公布日期 2000.09.12
申请号 US19970922892 申请日期 1997.09.03
申请人 SEIKO INSTRUMENTS, INC. 发明人 KOYAMA, YOSHIHIRO;SUGIYAMA, YASUHIKO
分类号 B21C51/00;C23F4/00;G01B11/02;G01Q60/44;H01J37/09;H01J37/141;H01J37/153;H01J37/30;H01J37/302;H01J37/304;H01J37/305;(IPC1-7):H01J37/28 主分类号 B21C51/00
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