发明名称 |
Vehicular control apparatus arranged for undergoing initial failure test after burn-in and method arranged therefor |
摘要 |
In a vehicular control apparatus having a bare-chip mounting type vehicular electronic unit and an associated vehicular actuator, a predetermined higher bias voltage (approximately 7 volts higher than a normal bias voltage of approximately 5 volts) is supplied to a micro controller of the electronic unit so as to impose a high stress on the micro controller under a burn-in condition such that the micro controller is exposed to a burn-in high temperature for a burn-in time duration. After the above-described burn-in process, an external initial failure testing purpose program is transmitted to a serial communication circuit of the micro controller so that the micro controller executes instructions of the external initial failure testing purpose program to evaluate an operation of the micro controller to determine whether an initial failure in the micro controller occurs. |
申请公布号 |
US6119064(A) |
申请公布日期 |
2000.09.12 |
申请号 |
US19970980428 |
申请日期 |
1997.11.28 |
申请人 |
NISSAN MOTOR CO., LTD. |
发明人 |
NAKAGURO, KUNIO;KIMURA, TAKASHI |
分类号 |
G01R31/00;G01R31/28;G06F11/267;(IPC1-7):G01M15/00 |
主分类号 |
G01R31/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|