发明名称 |
Method and device for setting a plurality of test modes using external pins |
摘要 |
A method for setting test modes in a semiconductor ship and a device suitable for the method are provided. In the method, a power voltage is externally applied to the semiconductor chip. A predetermined signal is applied to an arbitrary selected external pin of the semiconductor chip. A first-state signal is applied to the test pin and a second-state signal is applied to the test pin a predetermined time later. The signal applied to the external pin is latched by the first-state signal applied to the test pin. The second-state signal applied to the test pin, a predetermined signal output when the first-state signal applied to the test pin is shifted to the second-state signal, and the latched signal are logically combined and the combined signal is output.
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申请公布号 |
US6119253(A) |
申请公布日期 |
2000.09.12 |
申请号 |
US19970953055 |
申请日期 |
1997.10.17 |
申请人 |
SAMSUNG ELECTRONICS, CO., LTD. |
发明人 |
KIM, WON-KYUM;JUNG, KWANG-JAE |
分类号 |
G01R31/28;G01R31/317;G01R31/3185;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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