发明名称 Cleaning method and system of semiconductor substrate and production method of cleaning solution
摘要 A cleaning method for a semiconductor substrate is provided. After pure water is supplied to a cleaning tank, a chlorine gas is supplied to the pure water to thereby generate chloride ions, hypochlorite ions, chlorite ions, and chlorate ions in the pure water. Then, a semiconductor substrate is immersed into the pure water containing the chloride ions, hypochlorite ions, chlorite ions, and chlorate ions. The fabrication cost of a semiconductor device and adverse effects on the earth environment can be reduced. The concentration of the dissolved chlorine gas in the pure water is preferably in the range from 0.003 to 0.3% by weight.
申请公布号 US6116254(A) 申请公布日期 2000.09.12
申请号 US19960627242 申请日期 1996.04.01
申请人 NEC CORPORATION 发明人 SHIRAMIZU, YOSHIMI
分类号 C11D7/60;B08B3/08;C02F1/42;H01L21/00;H01L21/304;H01L21/306;H01L21/308;(IPC1-7):B08B3/00 主分类号 C11D7/60
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