发明名称 METHOD AND DEVICE FOR CONNECTING MANUFACTURE TEST INTERFACE TO GLOBAL SERIAL BUS INCLUDING I2C BUS
摘要 PROBLEM TO BE SOLVED: To provide the method and device for connecting a manufacture test interface to a global serial bus such as an inter-integrated circuit (I2C) bus. SOLUTION: An input buffer logic circuit 201 buffers the data to be transferred to/from a global serial bus 106. A slave interface logic circuit 204 connected to the circuit 201 receives the data and sends them to the circuit 201. A slave controller 206 connected to the circuit 201 and the circuit 204 adjusts the data exchanging pace in response to the circuit 201. An error detection logic circuit 203 is connected between an input/output buffer and the bus 106 for detecting an error condition.
申请公布号 JP2000242573(A) 申请公布日期 2000.09.08
申请号 JP20000039822 申请日期 2000.02.17
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 GUY RICHARD KURIE;JAMES SCORT HAAVURANDO;SHARON DENOS VINCENT;PAUL LEONARD URUTOGEN
分类号 G06F13/00;G06F13/42;(IPC1-7):G06F13/00 主分类号 G06F13/00
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