发明名称 TEMPERATURE CHARACTERISTIC MEASURING DEVICE AND TEMPERATURE CHARACTERISTIC, MEASURING METHOD BY USING IT
摘要 PROBLEM TO BE SOLVED: To provide a temperature characteristic measuring device capable of measuring a temperature characteristic accurately in a short time. SOLUTION: A tunnel kiln 1 is controlled to have a desired temperature profile by using a temperature control device 3. A conveyance means 2 is operated after arranging a measuring object 6 thereon, and a temperature profile inside the tunnel kiln 1 is stabilized. A temperature sensor 7 is arranged on the conveyance means 2 and conveyed inside the tunnel kiln 1. Simultaneously, the temperature profile inside the tunnel kiln 1 is measured by using a temperature measuring means 4, and a resistance value measurement position in the tunnel kiln 1 is decided from the result. The conveyance means 2 where the measuring object 6 is arranged is operated at a prescribed speed, when passing through the tunnel kiln 1, a resistance value on the resistance value measurement position is measured by using a resistance value measuring means 5.
申请公布号 JP2000241478(A) 申请公布日期 2000.09.08
申请号 JP19990041205 申请日期 1999.02.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MORIWAKE HIRONORI
分类号 H01C7/04;G01R27/02;G01R31/00;(IPC1-7):G01R31/00 主分类号 H01C7/04
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