发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To realize a high switching speed by reducing a parasitic capacity of a transistor. SOLUTION: A gate electrode 105 in a groove 103 made in a field relaxing region 102 and a base region 106 on a semiconductor substrate 101 is made to have a three-layer structure, and a step difference between a surface of the gate electrode 105 and base region 106 in the groove 103 is set to be within 500A so that diffusion layers of the source and base regions 107 and 106 can be made shallow.
申请公布号 JP2000243952(A) 申请公布日期 2000.09.08
申请号 JP19990042245 申请日期 1999.02.19
申请人 NEC CORP 发明人 NINOMIYA HITOSHI
分类号 H01L29/78;H01L21/336;(IPC1-7):H01L29/78 主分类号 H01L29/78
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