发明名称 X-RAY INSPECTION APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To obtain an X-ray inspection apparatus by which the defect of an inspected object can be inspected more surely. SOLUTION: An X-ray irradiation part 16 on which a product 10 is irradiated with X-rays from the side part is installed in an inspection position on a conegeyance conveyor 12. An X-ray imaging part 20 which images the transmission image of the product 10 by the X-rays from the X-ray irradiation part 16 is installed in the side part of the inspection position on the conveyance conveyor 12. An image processing part 28 processes and inspects the image of the product 10 which is imaged by the X-ray imaging part 20. The X-ray irradiation part 16 and the X-ray imaging part 20 can be moved up and down by a movement mechanism 30 and a movement mechanism 32. Thereby, an imaging direction can be changed freely, and it is possible to obtain the transmission image from a proper direction according to an inspected object.</p>
申请公布号 JP2000241368(A) 申请公布日期 2000.09.08
申请号 JP19990044644 申请日期 1999.02.23
申请人 STABIC:KK 发明人 SOGA NOBUYUKI;TOMITA MASAICHI;OSHIMA YASUHIRO
分类号 G01N23/10;G01N23/04;G21K5/10;(IPC1-7):G01N23/10 主分类号 G01N23/10
代理机构 代理人
主权项
地址