发明名称 Method and apparatus for process control of semiconductor fabrication
摘要 <p>A lot-base management host computer 11 performs management of wafers with a lot as a unit by managing a process condition for each lot, a correspondence between a carrier ID and a slot ID, and a correspondence between a slot ID and a wafer ID in each lot. A wafer-base management host computer 12 performs management for each wafer in a lot by managing a process condition corresponding to a wafer number in a lot. A converted-condition instructing section 13 transmits data acquired from computers 11, 12 to a semiconductor fabrication apparatus 14. The wafer-base management host computer stores a process condition for each level and a machine number of a semiconductor fabrication apparatus in the form of a matrix as an experimental level master, and issues a process condition to the semiconductor fabrication apparatus through the converted-condition instructing section according to the master for experimental levels.</p>
申请公布号 GB2347522(A) 申请公布日期 2000.09.06
申请号 GB20000005110 申请日期 2000.03.02
申请人 * NEC CORPORATION 发明人 TOSHIHIRO * SADA;JUNJI * ORIMOTO
分类号 H01L21/02;G05B19/418;H01L21/00;(IPC1-7):H01L21/02 主分类号 H01L21/02
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