发明名称 WIRE STRUCTURE OF SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF
摘要 PURPOSE: A wire structure of a semiconductor device and forming method thereof is to suppress electromigration and increase of resistance in a wire of a semiconductor device. CONSTITUTION: A wire structure of a semiconductor device comprises: a main wire material layer(72); a first conductive layer(73) reacted with the main wire material layer and containing an amount of nitrogen smaller than the nitrogen amount of the stoichiometry, for improving the directionality and adhesive force of the main wire material layer; and a second conductive layer(74) disposed on the first conductive layer and made of the same material with the first conductive layer. The first and second conductive layers are stacked on the main wire material in the named order to improve via resistance and oxidation of the main wire material layer and are then thermally annealed.
申请公布号 KR20000055225(A) 申请公布日期 2000.09.05
申请号 KR19990003738 申请日期 1999.02.04
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, JUN GI
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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